RailroadBookstore.com

Railroad Books - Model Railroad Books - Thomas & Friends
Photography Books - Gardening Books

Photography Books

Huge Selection - Discount Prices - Money Back Guarantee

We offer a huge selection of photography books at discount prices. All purchases have a money back satisfaction guarantee. Thank you for shopping here!

Search Advanced SearchView Cart   Checkout   
Guidebooks
Canon
Hasselblad
Kodak
Leica
Nikon
Pentax
Sony
Magic Lantern Guides
Categories
General
Black & White
Color
Digital
Equipment
How To
Nature & Wildlife
Photo Essays
Photojournalism
Reference
Travel
Photoshop
Lightroom
Railroad Photography
Images of Rail Series

Electron Microscopy of Interfaces in Metals and Alloys (Electron Microscopy in Materials Science Series)

Electron Microscopy of Interfaces in Metals and Alloys (Electron Microscopy in Materials Science Series)

zoom enlarge 
Authors: C.t Forwood, L.m Clarebrough
Publisher: Adam Hilger
Category: Book

List Price: $210.00
Buy New: $99.75
You Save: $110.25 (52%)



New (6) Used (9) from $21.95

Sales Rank: 1897388

Media: Hardcover
Edition: 1
Number Of Items: 1
Pages: 424
Shipping Weight (lbs): 2
Dimensions (in): 9.2 x 6.1 x 0.9

ISBN: 0750301163
Dewey Decimal Number: 620.1699
EAN: 9780750301169
ASIN: 0750301163

Publication Date: January 1, 1991
Availability: Usually ships in 1-2 business days
Shipping: Expedited shipping available
Shipping: International shipping available
Condition: Brand New Book. Ships with Delivery Confirmation. Satisfaction Guaranteed!

Editorial Reviews:

Product Description
Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphaseinterfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.


Copyright 2008 - RailroadBookstore.com